Testing Static Random Access Memories: Defects, Fault Models and Test Patterns: 26 (Frontiers in Electronic Testing)

Price: ₹6,200.00
(as of Mar 24,2023 18:00:15 UTC – Details)

Publisher ‏ : ‎ Springer; 2004th edition (31 March 2004)
Language ‏ : ‎ English
Hardcover ‏ : ‎ 221 pages
ISBN-10 ‏ : ‎ 1402077521
ISBN-13 ‏ : ‎ 978-1402077524
Item Weight ‏ : ‎ 1 kg 150 g
Dimensions ‏ : ‎ 15.6 x 1.43 x 23.4 cm